Hans-Ulrich Danzebrink

发表

Rastermikroskopie im Nah- und Fernfeld an Strukturen im Submikrometerbereich

Heinrich Geuther, Klaus-Peter Schröder, Hans-Ulrich Danzebrink, 1994 .

NEW DEVELOPMENTS OF MEASUREMENT STANDARDS AND PROCEDURES FOR MICRO AND NANOMETROLOGY AT THE PTB

Thorsten Dziomba, Ludger Koenders, Hans-Ulrich Danzebrink, 2013 .

Field programmable gate array based digital lock-in amplifier for highest resolution heterodyne interferometer

Hans-Ulrich Danzebrink, Sebastian Strube, Gabor Molnar, 2014 .

True 3D measurements of micro and nano structures

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2011 .

Micro Coordinate Measurement Machine (μCMM) using voice coil actuator with interferometric position feedback

Hans-Ulrich Danzebrink, Sebastian Bütefisch, Jens Flügge, 2019, International Symposium on Precision Engineering Measurement and Instrumentation.

Rastersondenmetrologie: Vom metrologischen Rasterkraftmikroskop zum Mikro- und NanokoordinatenmessgerätScanning Probe Metrology: From the Metrological SFM to the Micro/Nano CMM

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2009 .

Improving the performance of interferometers in metrological scanning probe microscopes

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2004 .

The Scanning Force Microscope as a measuring tool

Hans-Ulrich Danzebrink, Physikalisch-Technische Bundesanstalt, Ludger Koenders, 2006 .

Neuere Entwicklungen von Normalen für die 3D-Mikro- und Nanometrologie

Hans-Ulrich Danzebrink, Harald Bosse, Michael Neugebauer, 2011 .

Oxide layer mass determination at the silicon sphere of the Avogadro Project

Hans-Ulrich Danzebrink, Michael Krumrey, Horst Bettin, 2008, 2008 Conference on Precision Electromagnetic Measurements Digest.

Compact field programmable gate array (FPGA)-based multi-axial interferometer for simultaneous tilt and distance measurement in the sub-nanometre range

Hans-Ulrich Danzebrink, Sebastian Strube, Gabor Molnar, 2011 .

Metrological Large Range Scanning Force Microscope Applicable for Traceable Calibration of Surface Textures

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2006 .

Optical imaging module for astigmatic detection system.

Ing-Shouh Hwang, Kuang-Yuh Huang, Hans-Ulrich Danzebrink, 2016, The Review of scientific instruments.

Atomic force probe for sidewall scanning of nano- and microstructures

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2006 .

Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

Hans-Ulrich Danzebrink, James W. G. Tyrrell, Dmitri V. Sokolov, 2003 .

Metrological Scanning Probe Microscopes ‐ Instruments for Dimensional Nanometrology

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2006 .

Development of a combined interference microscope objective and scanning probe microscope

Hans-Ulrich Danzebrink, Rolf Krüger-Sehm, James W. G. Tyrrell, 2004 .

Nanoscale surface measurements at sidewalls of nano- and micro-structures

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2007 .

Development of a 3D-AFM for true 3D measurements of nanostructures

Gaoliang Dai, Ludger Koenders, Hans-Ulrich Danzebrink, 2011 .

Measurement of micro-roughness using a metrological large range scanning force microscope

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2004 .

Metrological large range scanning probe microscope

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2004 .

Atomic force microscope cantilever based microcoordinate measuring probe for true three-dimensional measurements of microstructures

Gaoliang Dai, Hans-Ulrich Danzebrink, Helmut Wolff, 2007 .

Accurate and traceable measurement of nano- and microstructures

Gaoliang Dai, Frank Pohlenz, Ludger Koenders, 2006 .

Bilateral comparison of 25 nm pitch nanometric lateral scales for metrological scanning probe microscopes

Osamu Sato, Toshiyuki Takatsuji, Ichiko Misumi, 2010 .

A high precision micro/nano CMM using piezoresistive tactile probes

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2009 .