Andrea Stefani

发表

Reliability study of organic complementary logic inverters using constant voltage stress

Gaudenzio Meneghesso, Michele Muccini, Nicola Wrachien, 2015 .

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states

Gaudenzio Meneghesso, Michele Muccini, Nicola Wrachien, 2014, Microelectron. Reliab..

Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric

Gaudenzio Meneghesso, Michele Muccini, Raffaella Capelli, 2013, Microelectron. Reliab..

A transparent organic transistor structure for bidirectional stimulation and recording of primary neurons.

Michela Chiappalone, Anna Sagnella, Valentina Benfenati, 2013, Nature materials.