Hongzhong Xu

发表

B. Baird, Young Chung, Hongzhong Xu, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Bin Shi, Dan Zhang, Yijie Sun, 2016, J. Sensors.

Zhihong Zhang, Won-Gi Min, Hongning Yang, 2008, 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Won-Gi Min, B. Baird, Young Chung, 2005, Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..