Hongzhong Xu
发表
B. Baird,
Young Chung,
Hongzhong Xu,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
Bin Shi,
Dan Zhang,
Yijie Sun,
2016,
J. Sensors.
Zhihong Zhang,
Won-Gi Min,
Hongning Yang,
2008,
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
Peng Gu,
Wenjie Hu,
Yijie Sun,
2017,
Sensors.
Won-Gi Min,
B. Baird,
Young Chung,
2005,
Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..
Bin Chen,
Bin Shi,
Junqi Gao,
2003
.
Zengru Di,
Qinghua Chen,
Xiaomeng Li,
2016,
Scientific Reports.