Junho Kim

Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI

Hoyoung Kang, Hyun-Chul Sagong, Junekyun Park, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

New 4-dimensional constellation-rotation modulation method for DVB-NGH

Taejin Jung, Gwangsoon Lee, Hojun Kim, 2011, 2011 IEEE International Conference on Consumer Electronics (ICCE).