Eunkyeong Choi

发表

Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI

Hoyoung Kang, Hyun-Chul Sagong, Junekyun Park, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

PS6-5 Development of a Hip Impact Simulator and a Preliminary Evaluation of Hip Protectors(PS6: Poster Short Presentation VI,Poster Session)

Jongman Kim, Baekdong Cha, Youngho Kim, 2015 .

Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism

Minwoo Lee, Jongwoo Park, Sangchul Shin, 2015, 2015 IEEE International Reliability Physics Symposium.