F. Dobbelaere

Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

S. Criel, L. Martens, R. De Smedt, 1996, Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec.