C.F. Hawkins

Reliability, test, and I/sub DDQ/ measurements

A. Keshavarzi, C.F. Hawkins, J.M. Soden, 1997, Digest of Papers IEEE International Workshop on IDDQ Testing.

Identifying defects in deep-submicron CMOS ICs

C.F. Hawkins, J.M. Soden, A.C. Miller, 1996, IEEE Spectrum.

Zero defects or zero stuck-at faults-CMOS IC process improvement with I/sub DDQ/

R. R. Fritzemeier, C.F. Hawkins, J.M. Soden, 1990, Proceedings. International Test Conference 1990.

CMOS IC reliability indicators and burn-in economics

A.W. Righter, C.F. Hawkins, J.M. Soden, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Transient current testing based on current (charge) integration

R. Picos, M. Roca, J. Segura, 1998, Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232).

Charge based testing (CBT) of submicron CMOS SRAMs

C.F. Hawkins, M. Rosales, I. de Paul, 2000, Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637).

The economics of guardband placement

C.F. Hawkins, R.H. Williams, Richard H. Williams, 1993, Proceedings of IEEE International Test Conference - (ITC).