Fatima Adly

Randomized General Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Mohammed Ismail, Paul D. Yoo, Yousof Al-Hammadi, 2015, IEEE Transactions on Semiconductor Manufacturing.

Machine-Learning-Based Identification of Defect Patterns in Semiconductor Wafer Maps: An Overview and Proposal

Paul D. Yoo, Yousof Al-Hammadi, Sami Muhaidat, 2014, 2014 IEEE International Parallel & Distributed Processing Symposium Workshops.

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Mohammed Ismail, Paul D. Yoo, Yousof Al-Hammadi, 2015, IEEE Transactions on Industrial Informatics.