V. Kanevsky

Bayesian fault diagnosis in large-scale measurement systems

L. Barford, V. Kanevsky, L. Kamas, 2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).

Statistical on-chip interconnect modeling : an application of automatic differentiation.

Norman Chang, C. Bischof, S.-Y. Oh, 1998, DAC 1998.

Consensus in Small and Large Audiences

V. Kanevsky, A. Garcia, V. Naroditsky, 1992 .