François Dieudonné

Low frequency noise in 0.12 mum partially and fully depleted SOI technology

Sébastien Haendler, Francis Balestra, Jalal Jomaah, 2003, Microelectron. Reliab..

On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs

George J. Papaioannou, Francis Balestra, Jalal Jomaah, 2004, Microelectron. Reliab..

An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's

Francis Balestra, Jalal Jomaah, François Dieudonné, 2001, Microelectron. Reliab..