C. Roda Neve

Quasi-optical technique for sensing bond quality of silicon wafers

J.-P. Raskin, J. Stiens, R. Vounckx, 2010, Photonics Europe.

Wide-Band Simulation and Characterization of Digital Substrate Noise in SOI Technology

J.-P. Raskin, D. Flandre, D. Bol, 2007, 2007 IEEE International SOI Conference.

RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer

A. Gharsallah, C. Roda Neve, J.-P Raskin, 2012, 2012 IEEE International SOI Conference (SOI).

RF Harmonic Distortion of CPW Lines on HR-Si and Trap-Rich HR-Si Substrates

J-P Raskin, C. Roda Neve, J. Raskin, 2012, IEEE Transactions on Electron Devices.

Impact of neutron irradiation on oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer

D. Flandre, C. Roda Neve, D. Lederer, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Ultrawide Frequency Range Crosstalk Into Standard and Trap-Rich High Resistivity Silicon Substrates

A. Gharsallah, C. Roda Neve, J. Raskin, 2011, IEEE Transactions on Electron Devices.