Sayeem Bin Kutub

Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs

Tian-Li Wu, Sayeem Bin Kutub, Tian-Li Wu, 2020, IEEE Transactions on Electron Devices.

Robust Forward Gate Bias TDDB Stability in Enhancement-mode Fully Recessed Gate GaN MIS-FETs with ALD Al2O3Gate Dielectric

Sayeem Bin Kutub, Tian-Li Wu, Shun-Wei Tang, 2020, 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Artificial Neural Network-Based (ANN) Approach for Characteristics Modeling and Prediction in GaN-on-Si Power Devices

Sayeem Bin Kutub, Tian-Li Wu, Wen-Jay Lee, 2020, 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).