Sergey Ostanin

发表

Fault-tolerant high performance scheme design

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, 2015, 2015 IEEE East-West Design & Test Symposium (EWDTS).

Increasing Manufacturing Yield Using Partially Programmable Circuits with CLB Implementation of Incompletely Specified Boolean Function of the Corresponding Sub-Circuit

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, 2015, 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems.

Preventing and masking Trojan circuits triggering out of working area

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, 2017, 2017 European Conference on Circuit Theory and Design (ECCTD).

Partially programmable circuit design

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, 2014, Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014).

Observability calculation of state variable oriented to robust PDFs and LOC or LOS techniques

Anzhela Yu. Matrosova, Sergey Ostanin, Alexey Melnikov, 2013, East-West Design & Test Symposium (EWDTS 2013).

Logic circuit design with gates, LUTs and MUXs oriented to mask faults

Anzhela Yu. Matrosova, Sergey Ostanin, Natalia Butorina, 2017, 2017 IEEE East-West Design & Test Symposium (EWDTS).

A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit

Anzhela Yu. Matrosova, Sergey Ostanin, Natalia Butorina, 2016, 2016 IEEE East-West Design & Test Symposium (EWDTS).

Trojan circuits preventing and masking in sequential circuits

Sergey Ostanin, Irina Kirienko, Eugeniy Mitrofanov, 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS).

Detection and masking of Trojan Circuits in sequential logic

Anzhela Yu. Matrosova, Sergey Ostanin, Ekaterina Nikolaeva, 2017, 2017 IEEE East-West Design & Test Symposium (EWDTS).

Implementation by the special formula of an arbitrary subset of code words of (m, n)-code for designing a self-testing checker

Sergey Ostanin, Natalia Butorina, 2011, 2011 9th East-West Design & Test Symposium (EWDTS).

Testable combinational circuit design based on free ZDD-implementation of irredundant SOPof Boolean function

Sergey Ostanin, 2013, East-West Design & Test Symposium (EWDTS 2013).

Fault latencies of concurrent checking FSMs

Sergey Ostanin, Ilya Levin, Roman Goot, 2002, Proceedings Euromicro Symposium on Digital System Design. Architectures, Methods and Tools.

Finding False Paths for Sequential Circuits Using Operations on ROBDDs

Anzhela Yu. Matrosova, Sergey Ostanin, Semen Chernyshov, 2018, 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS).

Self-checking synchronous FSM network design for path delay faults

Sergey Ostanin, 2017, 2017 IEEE East-West Design & Test Symposium (EWDTS).

Sequential circuits applicable for detecting different types of faults

Sergey Ostanin, Mark G. Karpovsky, Ilya Levin, 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).

Self-checking FSM design with observing only FSM outputs

Anzhela Yu. Matrosova, Sergey Ostanin, 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

Testable combinational circuit design based on ZDD-implementation of ISOP Boolean function

Sergey Ostanin, R. Muchamedov, 2010, 2010 East-West Design & Test Symposium (EWDTS).

Self-checking Synchronous FSM Network Design with Low Overhead

Anzhela Yu. Matrosova, Sergey Ostanin, I. Levin, 2000, VLSI Design.

Self-checking sequential circuits with self-healing ability

Sergey Ostanin, Mark G. Karpovsky, Ilya Levin, 2002, GLSVLSI '02.

Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs

Sergey Ostanin, Ekaterina Nikolaeva, Anjela Yu. Matrosova, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).

A fault-tolerant combinational circuit design

Sergey Ostanin, Irina Kirienko, V. Lavrov, 2015, 2015 IEEE East-West Design & Test Symposium (EWDTS).

A fault-tolerant sequential circuit design for SAFs and PDFs soft errors

Anzhela Yu. Matrosova, Sergey Ostanin, Irina Kirienko, 2016, 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS).