Lance Rushing

HBT Epitaxial Material Matching and Qualification for High Volume Production

C. Cismaru, Peter J. Zampardi, Mike Sun, 2009 .

A High Yield Manufacturable BiFET Epitaxial Profile and Process for High Volume Production

Jiang Li, C. Cismaru, V. Ho, 2006 .

Reliability Evaluation of InGaAsN for PA Handset Applications

Mike Sun, Lance Rushing, R. E. Welser, 2005 .