Takayuki Hisaka

Characteristics of SiN/GaAs interface under exposure to high-temperature and high-humidity conditions measured by photoreflectance spectroscopy

Hajime Sasaki, Kaoru Kadoiwa, Yasufumi Fujiwara, 2012, IEICE Electron. Express.

Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs

Hajime Sasaki, Kaoru Kadoiwa, Takeshi Ohshima, 2018, Microelectron. Reliab..

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

Kenji Hosogi, Hajime Sasaki, Naohito Yoshida, 2009, Microelectron. Reliab..

Simultaneous achievement of high performance and high reliability in a 38/77GHz InGaAs/AlGaAs PHEMT MMIC

Hajime Sasaki, Takayuki Kato, Naohito Yoshida, 2010, IEICE Electron. Express.

Degradation mechanisms of GaAs PHEMTs in high humidity conditions

Hajime Sasaki, Kazuo Hayashi, Naohito Yoshida, 2004, JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004..