Y. Hayashi
发表
S. Saito,
T. Ito,
M. Aiki,
1991,
ICC 91 International Conference on Communications Conference Record.
Toyoji Yamamoto,
Y. Hayashi,
T. Ogura,
1998,
1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).
T. Ito,
M. Aiki,
H. Fukinuki,
1984
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Y. Fukada,
T. Takahashi,
Y. Hayashi,
1996,
Optical Fiber Communications, OFC..
Y. Hayashi,
M. Edahiro,
S. Kobayashi,
2000,
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407).
Y. Hayashi,
M. Tagami,
H. Ohtake,
2003,
IEEE International Electron Devices Meeting 2003.
T. Fukai,
T. Takeuchi,
T. Iwamoto,
2006,
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..
M. Tada,
Y. Hayashi,
H. Ohtake,
2004,
IEEE Transactions on Electron Devices.
T. Takeuchi,
M. Tada,
N. Inoue,
2006,
2006 International Electron Devices Meeting.
Y. Hayashi,
Y. Hayashi,
2002,
Proceedings of the IEEE 2002 International Interconnect Technology Conference (Cat. No.02EX519).
T. Fukai,
T. Takeuchi,
A. Tanabe,
2008,
2008 IEEE International Electron Devices Meeting.
M. Hane,
N. Inoue,
Y. Hayashi,
2011,
2011 International Electron Devices Meeting.
Y. Hayashi,
N. Furutake,
M. Ueki,
2002,
Digest. International Electron Devices Meeting,.
N. Inoue,
Y. Hayashi,
N. Furutake,
2011,
2011 IEEE International Interconnect Technology Conference.
T. Takeuchi,
M. Tada,
Y. Hayashi,
2007,
IEEE Transactions on Electron Devices.
T. Kikkawa,
M. Tada,
Y. Hayashi,
2008,
IEEE Transactions on Semiconductor Manufacturing.
Y. Amamiya,
A. Tanabe,
Y. Hayashi,
2008,
2008 International Interconnect Technology Conference.
T. Takeuchi,
N. Inoue,
Y. Hayashi,
2008,
2008 IEEE International Electron Devices Meeting.
Y. Hayashi,
S. Saito,
N. Furutake,
2008,
2008 International Interconnect Technology Conference.
T. Takeuchi,
M. Tada,
Y. Hayashi,
2007,
2007 IEEE International Electron Devices Meeting.
M. Tada,
Y. Hayashi,
M. Tagami,
2006,
IEEE Transactions on Semiconductor Manufacturing.
Y. Hayashi,
Naoya Inoue,
Y. Hayashi,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
T. Takeuchi,
Y. Hayashi,
F. Ito,
2005,
Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005..
M. Morimoto,
Y. Hayashi,
T. Kunio,
1989,
International Technical Digest on Electron Devices Meeting.
M. Hane,
Y. Hayashi,
H. Sunamura,
2012,
2012 Symposium on VLSI Technology (VLSIT).
T. Takeuchi,
M. Tada,
N. Inoue,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
T. Takeuchi,
M. Tada,
N. Inoue,
2008,
IEEE Transactions on Semiconductor Manufacturing.
A. Tanabe,
Y. Hayashi,
K. Hijioka,
2006,
2006 International Interconnect Technology Conference.
N. Inoue,
Y. Hayashi,
N. Furutake,
2004,
IEEE Transactions on Electron Devices.
Y. Hayashi,
T. Usami,
T. Onodera,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
M. Tada,
Y. Hayashi,
N. Furutake,
2007,
IEEE Transactions on Electron Devices.
T. Takeuchi,
M. Tada,
N. Inoue,
2007,
2007 IEEE International Interconnect Technology Conferencee.
T. Takeuchi,
M. Tada,
N. Inoue,
2006,
IEEE Transactions on Electron Devices.
T. Takeuchi,
N. Tanabe,
T. Matsuki,
1995,
1995 Symposium on VLSI Technology. Digest of Technical Papers.
M. Hane,
Y. Hayashi,
H. Sunamura,
2012,
2012 International Electron Devices Meeting.
M. Tada,
Y. Hayashi,
S. Saito,
2007,
2007 IEEE International Interconnect Technology Conferencee.