R. E. Mikawa

发表

Rail span analysis applied to a gate array

D. G. Pierce, M. R. Ackermann, R. E. Mikawa, 1986 .

Factors contributing to static RAM cell transient upset

M. R. Ackermann, R. E. Mikawa, 1986 .

Relationship between texture and electromigration lifetime in sputtered AI-1% Si thin films

Ann N. Campbell, D. B. Knorr, R. E. Mikawa, 1993 .

Structural damage at the Si/SiO2 interface resulting from electron injection in metal‐oxide‐semiconductor devices

R. E. Mikawa, P. Lenahan, 1985 .

Transient Radiation Effects in SOI Static RAM Cells

R. E. Mikawa, M. Ackermann, 1987, IEEE Transactions on Nuclear Science.

Electron spin resonance study of interface states induced by electron injection in metal‐oxide‐semiconductor devices

R. E. Mikawa, P. Lenahan, 1986 .

Generation of Paramagnetic Point Defects in Silicon Dioxide Films on Silicon Through Electron Injection and Exposure to Ionizing Radiation*

R. E. Mikawa, P. Dressendorfer, W. L. Warren, 1987 .

A Comparison of Ionizing Radiation and Hot Electron Effects in MOS Structures

R. E. Mikawa, P. Lenahan, 1984, IEEE Transactions on Nuclear Science.

Structure and properties of Al-1%Si thin films on Si as a function of gas impurities during DC magnetron-sputtered deposition

R. E. Mikawa, D. Frear, B. Draper, 1989 .

Dangling bonds and the Urbach tail in silicon

R. E. Mikawa, K. L. Brower, P. Lenahan, 1985 .