Henry H. K. Tang

SEMM-2: A new generation of single-event-effect modeling tools

Henry H. K. Tang, Henry H. K. Tang, 2008, IBM J. Res. Dev..

SOI FinFET soft error upset susceptibility and analysis

Kevin G. Stawiasz, Phil Oldiges, Conal E. Murray, 2015, 2015 IEEE International Reliability Physics Symposium.

Nuclear physics of cosmic ray interaction with semiconductor materials: Particle-induced soft errors from a physicist's perspective

Henry H. K. Tang, Henry H. K. Tang, 1996, IBM J. Res. Dev..

New simulation methodology for effects of radiation in semiconductor chip structures

David F. Heidel, Conal E. Murray, Michael S. Gordon, 2008, IBM J. Res. Dev..

Alpha-particle-induced upsets in advanced CMOS circuits and technology

David F. Heidel, Ethan H. Cannon, Phil Oldiges, 2008, IBM J. Res. Dev..