Wen-Ching Wu

MRAM defect analysis and fault modeling

Cheng-Wen Wu, Chin-Lung Su, Ming-Jer Kao, 2004, 2004 International Conferce on Test.

A memory built-in self-diagnosis design with syndrome compression

Cheng-Wen Wu, Chin-Lung Su, Rei-Fu Huang, 2004, Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004).

Embedded memory diagnostic data compression using differential address

Cheng-Wen Wu, Chin-Lung Su, Rei-Fu Huang, 2005, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT)..

Test pattern generation and clock disabling for test time and power reduction

Ji-Jan Chen, Kun-Lun Luo, Yeong-Jar Chang, 2005, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT)..