Tsukasa Oishi

发表

Masaki Tsukude, Kazutami Arimoto, Kazuyasu Fujishima, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

Hideharu Amano, Masashi Watanabe, Tadao Nakamura, 2014, 2014 IEEE COOL Chips XVII.

Shinji Kawai, Shigehiro Kuge, Toshihiro Abe, 2008, 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.

Hideharu Amano, Masashi Watanabe, Tadao Nakamura, 2014, 2014 Eighth IEEE/ACM International Symposium on Networks-on-Chip (NoCS).

Wei Zhang, Wei Kong, Yasunobu Nakase, 2011, IEEE Asian Solid-State Circuits Conference 2011.