Keith Baker

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Mixed signal test-techniques, applications and demands

Keith Baker, Andrew Richardson, A. P. Dorey, 1996 .

Basics of Structured English Immersion for Language-Minority Students.

Keith Baker, 1999 .

Defect-based delay testing of resistive vias-contacts a critical evaluation

Keith Baker, G. Gronthoud, M. Lousberg, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Knowledge-based system tool for high-level BIST design

Keith Baker, N. A. Jones, 1987, Microprocess. Microsystems.

The Strathclyde space systems database : a new life cycle sustainability assessment tool for the design of next generation green space systems

Christie Alisa Maddock, Massimiliano Vasile, Keith Baker, 2018 .

Application of joint time-frequency analysis in mixed signal testing

Keith Baker, Frank Bouwman, Taco Zwemstra, 1994, Proceedings., International Test Conference.

Ontology supported competency system

Shirley Williams, Keith Baker, Karsten Øster Lundqvist, 2011, Int. J. Knowl. Learn..

Microprocessors and software design tools

Keith Baker, 1979, Microprocess. Microsystems.

Using EDIF for Transfer of Test Data: Practical Experience

Keith Baker, Bas Verhelst, Richard Morren, 1992, Proceedings International Test Conference 1992.

Anesthesia Residents Preferentially Request Operating Room Case Assignments with Complex Cases

David Allbritton, Keith Baker, Jonathan P. Wanderer, 2017, Journal of Medical Systems.

An Analysis of the Economics of Self Test

Prab Varma, Keith Baker, Anthony P. Ambler, 1984, ITC.

Time-to-Market : an issue in Mixed-signal v Analogue

Keith Baker, 1992, Proceedings International Test Conference 1992.

5th Alvey vision Conference

Keith Baker, Kate Crennell, Kate Crennell, 1990, Image Vis. Comput..

Mixed signal test : techniques, applications and demands : Mixed signal & analogue IC test technology

A. P. Dorey, Keith Baker, Andrew Richardson, 1996 .

Parameter monitoring: Advantages and pitfalls

Keith Baker, Jochen A. G. Jess, Eric Bruls, 1993, Proceedings of IEEE International Test Conference - (ITC).

Specifying the system

Keith Baker, 1980, Microprocess. Microsystems.

The contribution of interstate engineers in establishing the national capital

Keith Baker, 2013 .

Microprocessor impact on commerce

Keith Baker, 1979, Microprocess. Microsystems.

Stuck-at faults, PPMs rejects or? What do the SIA roadmaps say?

Keith Baker, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

Improve complex software by using multiple microprocessors

Keith Baker, 1977, Microprocess..

SIA Roadmaps: Sunset Boulevard for l_DDQ.

Keith Baker, 1999 .

Analogue fault simulation based on layout dependent fault models

Keith Baker, Andrew M. D. Richardson, Eric Bruls, 1994, Proceedings., International Test Conference.

QTAG: a standard for test fixture based I/sub DDQ//I/sub SSQ/ monitors

Keith Baker, 1994, Proceedings., International Test Conference.

Secured cards terminal

Keith Baker, Johannes Maria Pleunis, 2004 .

Hickory Dickory Dock

Keith Baker, 2007 .

Plug & Play IDDQ Monitoring with QTAG

Keith Baker, T. F. Waayers, F. G. M. Bouwman, 1995 .

Improving Total IC Design Quality using Application Mode Testing

Keith Baker, Richard Morren, R. Mehtani, 1992, Proceedings International Test Conference 1992.

Macro-testability and the VSP

Keith Baker, R. Mehtani, C. M. Huizer, 1990, Proceedings. International Test Conference 1990.

A Fast Signature Simulation Tool for Built-In Self-Testing Circuits

Prab Varma, Keith Baker, R. Porter, 1987, 24th ACM/IEEE Design Automation Conference.

SIA Roadmaps: Sunset Boulevard for l/sub DDQ/

Keith Baker, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Plug-and-play I/sub DDQ/ Testing for test fixtures

Keith Baker, Alan Hales, 1995, IEEE Design & Test of Computers.

Intrusive interactivity is not an ambient experience

Keith Baker, 2006, IEEE Multimedia.

Shmoo Plotting: The Black Art of IC Testing

Keith Baker, Jos van Beers, 1997, IEEE Des. Test Comput..

I/sub DDQ/: you heard the hype, but what's really coming?

Keith Baker, 1996, Proceedings ED&TC European Design and Test Conference.

An apparatus for measuring a quiescent current of an integrated monolithic digital circuit, integrated monolithic digital circuit provided with such a device and testing apparatus provided with such a device.

Keith Baker, Evert Seevinck, Sebastiaan Constant Verhelst, 1989 .

Spice up your life: simulate mixed-signal ICs!

Keith Baker, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?

Will R. Moore, Guido Gronthoud, Keith Baker, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

Overview of the Mars Science Laboratory Parachute Decelerator System

Joe Morris, Mike Kandis, Keith Baker, 2007 .

Shmoo Plots - the Black Art of IC Test

Keith Baker, Jos van Beers, 1996 .

Test evaluation for complex mixed-signal ICs by introducing layout dependent faults

Keith Baker, Andrew Richardson, R.J.A. Harvey, 1993 .

Arrangement for determining a quiescent current of an integrated monolithic digital circuit, integrated monolithic digital circuit with such an arrangement and test apparatus with such an arrangement.

Keith Baker, Evert Seevinck, Sebastiaan Constant Verhelst, 1990 .

Plug & play I/sub DDQ/ monitoring with QTAG

Keith Baker, T. F. Waayers, F. G. M. Bouwman, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

On-chip testing of embedded p.l.a.s

Keith Baker, A. P. Ambler, P. Varma, 1985 .

The Grid2003 production grid: principles and practice

Jason Lee, Paul Avery, Alex Rodriguez, 2004, Proceedings. 13th IEEE International Symposium on High performance Distributed Computing, 2004..

Torque Kills! Future Control of the Ambient Electromagnetic Spectrum

Keith Baker, 2007, IEEE MultiMedia.

Development of a class 1 QTAG monitor

Keith Baker, Andrew M. D. Richardson, A. H. Bratt, 1994, Proceedings., International Test Conference.

I/sub DDQ/ testing because 'zero defects isn't enough': a Philips perspective

Keith Baker, Bas Verhelst, 1990, Proceedings. International Test Conference 1990.

Shmoo plotting: the black art of IC testing

Keith Baker, Jos van Beers, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Improving the prediction of UK domestic energy-demand using annual consumption-data

Keith Baker, R. M. Rylatt, R. Mark Rylatt, 2008 .

Carbon Management in the Built Environment

Keith Baker, Rohinton Emmanuel, R. Emmanuel, 2012 .