S. Y. Lee

Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))

G. C. Kang, Dong-Hyun Kim, Jong-Bong Park, 2007 .

Dynamic analysis of baffled fuel‐storage tanks using the ALE finite element method

S. Y. Lee, J. R. Cho, J. Cho, 2003 .