Wimol San-Um

A Low-Cost High-Speed Pulse Response Based Built-In Self Test For Analog Integrated Circuits

Wimol San-Um, Tachibana Masayoshi, Non-members, 2009 .

A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

Masayoshi Tachibana, Wimol San-Um, 2010, IEICE Trans. Inf. Syst..

A Utility Paradigm and Roadmap of Internet-of-Things in Thailand for Digital Economy Development towards ASEAN Economic Community

Wimol San-Um, Thanaruk Theeramunkong, Jeerana Noymanee, 2016, IoTBD.

Impulse signal generation and measurement technique for cost-effective Built-In Self Test in analog mixed-signal systems

Wimol San-Um, Tachibana Masayoshi, 2009, 2009 52nd IEEE International Midwest Symposium on Circuits and Systems.

The Implementation of a Wireless-remote Arduino-compatible Programmable Logic Controller with Smart User Interface Towards Industrial Internet of Things

Wimol San-Um, Tossaporn Wetsiri, 2016, IoTBD.

Data Encryption Scheme Based on Rules of Cellular Automata and Chaotic Map Function for Information Security

Wimol San-Um, Warakorn Srichavengsup, W. San-Um, 2016, Int. J. Netw. Secur..

Digital Chaotic Signal Generator Using Robust Chaos in Compound Sinusoidal Maps

Wimol San-Um, Chatchai Wannaboon, 2014, IEICE Trans. Fundam. Electron. Commun. Comput. Sci..

Phase difference analysis technique for parametric faults BIST in CMOS analog circuits

Masayoshi Tachibana, Wimol San-Um, Chatchai Wannaboon, 2018, IEICE Electron. Express.

The Monitoring of Three-Dimensional Printer Filament Feeding Process using an Acoustic Emission Sensor

Wimol San-Um, Pitchapa Lotrakul, Masaaki Takahashi, 2017 .

A regulated supply tunning voltage-controlled oscillator with built-in test and calibration

Wimol San-Um, Tachibana Masayoshi, 2010, ECTI-CON2010: The 2010 ECTI International Confernce on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology.

A low-jitter supply-regulated charge pump phase-locked loop with built-in test and calibration

Masayoshi Tachibana, Wimol San-Um, W. San-Um, 2010, Proceedings of 2010 IEEE International Symposium on Circuits and Systems.

Simultaneous impulse stimulation and response sampling technique for built-in self test of linear analog integrated circuits

Masayoshi Tachibana, Wimol San-Um, 2009, SBCCI.

A simple current-reversible chaotic jerk circuit using inherent tanh(x) of an opamp

Masayoshi Tachibana, Wimol San-Um, Patinya Ketthong, 2017, IEICE Electron. Express.