Christopher C. Walton

Effect of silica overlayers on laser damage of HfO2-SiO2 56 degrees incidence high reflectors

Robert Chow, Francois Y. Genin, Mark R. Kozlowski, 1996, Laser Damage.

Ultra-high accuracy optical testing: creating diffraction-limited short-wavelength optical systems

Anton Barty, Regina Soufli, Erik H. Anderson, 2005, SPIE Optics + Photonics.

Multilayer optics for an extreme-ultraviolet lithography tool with 70-nm resolution

Regina Soufli, Stanley Mrowka, Claude Montcalm, 2001, SPIE Advanced Lithography.

Optical and multilayer design for the first Kirkpatrick-Baez optics for x-ray diagnostic at NIF

Todd A. Decker, Tom Pardini, Paul B. Mirkarimi, 2013, Optics & Photonics - Optical Engineering + Applications.