Michael Schulz

发表

Control and Health Monitoring of Variable Speed Wind Power Generation Systems; Period of Performance: 10 July 1997 - 10 July 2000

Yongduan Song, Marwan Bikdash, Michael Schulz, 2001 .

SimOptDevice: a library for virtual optical experiments

Clemens Elster, Michael Schulz, Reyko Schachtschneider, 2019, Journal of Sensors and Sensor Systems.

Sensitivity analysis of tilted-wave interferometer asphere measurements using virtual experiments

Wolfgang Osten, Axel Wiegmann, Clemens Elster, 2013, Optical Metrology.

Laser Sources for Metrology and Machine Vision

Michael Schulz, Ulrich Oechsner, Christian Knothe, 2016 .

Comparison of small angle deflectometric measurements with different apertures down to the sub-millimetre range

Michael Schulz, Gerd Ehret, Susanne Quabis, 2016, International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT).

Analysis of the uncertainty of the ultraprecise large-area curvature scanning technique for measuring steep aspheres and complex surfaces

Michael Schulz, Ingolf Weingaertner, 2001, Optics + Photonics.

Effects of misalignments on the modulation transfer function measurement of camera lenses analyzed in optomechanical simulations

Michael Schulz, Manuel Stavridis, Rainer Tutsch, 2020 .

Form measurement of large optics with deflectometric and interferometric procedures at PTB

Michael Schulz, Gerd Ehret, Sören Laubach, 2016, Precision Optics Manufacturing.

High-definition illuminated table for optical testing

Michael Schulz, Egbert Buhr, D. Bergmann, 1999, Optical Systems Design.

Alignment methods for ultraprecise deflectometric flatness metrology

Clemens Elster, Michael Schulz, Manuel Stavridis, 2011, Optical Metrology.

Measurement technique for the characterization of electronic still picture cameras

Michael Schulz, 1996, Advanced Imaging and Network Technologies.

Improvements in OTF measurement technique

Michael Schulz, 1993, Optical Systems Design.

Flatness metrology based on small-angle deflectometric procedures with electronic tiltmeters

Michael Schulz, Gerd Ehret, Sören Laubach, 2017, Precision Optics Manufacturing.

Automated Meter Reading Tackles High Bills

Michael Schulz, Michael J. Higgins, 1998 .

Measurement of aspheres and free-form surfaces in a non-null test interferometer: reconstruction of high-frequency errors

Wolfgang Osten, Goran Baer, Michael Schulz, 2013, Optical Metrology.

Traceability in interferometric form metrology

Clemens Elster, Michael Schulz, Manuel Stavridis, 2015, Optical Metrology.

Setup of a new form measurement system for flat and slightly curved optics with diameters up to 1.5 metres

Michael Schulz, Manuel Stavridis, Gerd Ehret, 2020, Precision Optics Manufacturing.

Steps towards traceability for an asphere interferometer

Clemens Elster, Michael Schulz, Manuel Stavridis, 2017, Optical Metrology.

Measurement of steep aspheres: a step forward to nanometer accuracy

Clemens Elster, Michael Schulz, Ingolf Weingaertner, 2001, SPIE Optics + Photonics.

Specialized Fiber Collimators

Michael Schulz, Ulrich Oechsner, Christian Knothe, 2014 .

High-accuracy profile form measurement by a scanning system consisting of an angle sensor and coupled distance sensors

Ralf D. Geckeler, Clemens Elster, Michael Schulz, 2005, SPIE Optical Metrology.

Signal Retrieval from Non-Sinusoidal Intensity Modulations in X-ray and Neutron Interferometry Using Piecewise-Defined Polynomial Function

Franz Pfeiffer, Michael Schulz, Julia Herzen, 2021, J. Imaging.

Evaluation of absolute form measurements using a tilted-wave interferometer.

Wolfgang Osten, Axel Wiegmann, Clemens Elster, 2016, Optics express.

Accuracy evaluation for sub-aperture interferometry measurements of a synchrotron mirror using virtual experiments

Frank Siewert, Axel Wiegmann, Clemens Elster, 2011 .

Topography measurement by a reliable large-area curvature sensor

Michael Schulz, 2001 .

Improving the lateral resolution of a multi-sensor profile measurement method by non-equidistant sensor spacing.

Axel Wiegmann, Clemens Elster, Michael Schulz, 2010, Optics express.

Optical measurement of absolute flatness with the deflectometric measurement systems at PTB

Michael Schulz, Gerd Ehret, Arne Fitzenreiter, 2013 .

Scanning deflectometric form measurement avoiding path-dependent angle measurement errors

Michael Schulz, Gerd Ehret, Arne Fitzenreiter, 2010 .

Analytical Jacobian and its application to tilted-wave interferometry.

Wolfgang Osten, Axel Wiegmann, Clemens Elster, 2014, Optics express.

High accuracy flatness metrology within the European Metrology Research Program

Michael Schulz, Gerd Ehret, Petr Křen, 2013 .

Concept, design and capability analysis of the new Deflectometric Flatness Reference at PTB

Clemens Elster, Michael Schulz, Manuel Stavridis, 2010 .

A New Flatness Reference Measurement System Based on Deflectometry and Difference Deflectometry

Clemens Elster, Michael Schulz, Manuel Stavridis, 2009 .

Interlaboratory comparison measurements of aspheres

Clemens Elster, Keishi Kubo, Christof Pruss, 2018 .

Traceable multiple sensor system for measuring curved surface profiles with high accuracy and high lateral resolution

Clemens Elster, Michael Schulz, 2006 .

Reconstructing surface profiles from curvature measurements

Clemens Elster, Michael Schulz, Joachim Gerhardt, 2002 .

Precise Optical Metrology Using Computational Shear Interferometry and an LCD Monitor as Light Source

Claas Falldorf, Michael Schulz, Gerd Ehret, 2014 .

Deflectometric systems for absolute flatness measurements at PTB

Clemens Elster, Michael Schulz, Manuel Stavridis, 2012 .