András E Vladár

Recovery of Background Structures in Nanoscale Helium Ion Microscope Imaging

Alfred S Carasso, András E Vladár, 2014, Journal of research of the National Institute of Standards and Technology.

Does your SEM really tell the truth? How would you know? Part 4: Charging and its mitigation

András E Vladár, Michael T Postek, A. Vladár, 2015, SPIE Scanning Microscopies.

Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research.

András E Vladár, Michael T Postek, Jeremiah R Lowney, 2002, Scanning.

Optimizing hybrid metrology: rigorous implementation of Bayesian and combined regression

Hui Zhou, Nien Fan Zhang, Mark-Alexander Henn, 2015, Journal of micro/nanolithography, MEMS, and MOEMS : JM3.

Particle size distributions by transmission electron microscopy: an interlaboratory comparison case study

Scott C. Brown, András E Vladár, Jiwen Zheng, 2013, Metrologia.

Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopy.

Hui Zhou, Francois Goasmat, Bryan M Barnes, 2013, Optics express.

Modeling for accurate dimensional scanning electron microscope metrology: then and now.

András E Vladár, Michael T Postek, 2011, Scanning.