YT Ngow

Accurate Memory Bitmapping based on Built-in Self-Test: Challenges and Solutions

Hao Hu, SH Goh, YH Chan, 2019, 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).

Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA

Hu Hao, Jeffrey Lam, SH Goh, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).