Helen Kim

Holistic metrology approach: hybrid metrology utilizing scatterometry, critical dimension-atomic force microscope and critical dimension-scanning electron microscope

Peter Ebersbach, Charles N. Archie, Alok Vaid, 2011 .

Simultaneous measurement of optical properties and geometry of resist using multiple scatterometry gratings

Nelson Felix, Timothy A. Brunner, Alok Vaid, 2010, Advanced Lithography.

A 76GHz PLL for mm-wave imaging applications

Charles G. Sodini, Helen Kim, Khoa M. Nguyen, 2010, 2010 IEEE MTT-S International Microwave Symposium.

AGN selection in the AKARI NEP deep field with the fuzzy SVM algorithm

Takamitsu Miyaji, Hideo Matsuhara, Toshinobu Takagi, 2019 .

A holistic metrology approach: hybrid metrology utilizing scatterometry, CD-AFM, and CD-SEM

Peter Ebersbach, Alok Vaid, Cornel Bozdog, 2011, Advanced Lithography.

"I Miss Green:" A Comparison of Prison and Space Shuttle Design

Helen Kim, 2011 .

TA 9.6 A 12GHz 30dB Modular BiCMOS Limiting Amplifier for 10Gb SONET Receiver

Helen Kim, Jonathan Bauman, 2000 .