Robert M. Moision

Simulation for risk assessment of diode single event burnout

Brendan Foran, Jesse Theiss, Robert M. Moision, 2015, 2015 IEEE Aerospace Conference.

Single Event Burnout Observed in Schottky Diodes

Jeffrey S. George, Robert M. Moision, Rocky Koga, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Root cause determination of on-orbit degradation of the VIIRS rotating telescope assembly

Chung-Tse Chu, James D. Barrie, Peter D. Fuqua, 2012, Optics & Photonics - Optical Engineering + Applications.

A partial least squares model for non-volatile residue quantification using diffuse reflectance infrared reflectance spectroscopy

Robert M. Moision, Amylynn Chen, R. Moision, 2016, Optical Engineering + Applications.