Changze Liu

On the statistical trap-response (STR) method for characterizing random trap occupancy and NBTI fluctuation

Ru Huang, Yangyuan Wang, Jinhua Liu, 2012, 2012 IEEE Silicon Nanoelectronics Workshop (SNW).

A unified approach for trap-aware device/circuit co-design in nanoscale CMOS technology

Ru Huang, Yangyuan Wang, Runsheng Wang, 2013, 2013 IEEE International Electron Devices Meeting.

Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits

Ru Huang, Shaofeng Yu, Yangyuan Wang, 2013, 2013 Symposium on VLSI Technology.

On the AC random telegraph noise (RTN) in MOS devices: An improved multi-phonon based model

Ru Huang, Runsheng Wang, Jibin Zou, 2012, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.

New observations on the AC random telegraph noise (AC RTN) in nano-MOSFETs

Ru Huang, Yangyuan Wang, Jinhua Liu, 2012, Proceedings of Technical Program of 2012 VLSI Technology, System and Application.

New insights into AC RTN in scaled high-к / metal-gate MOSFETs under digital circuit operations

Ru Huang, Shaofeng Yu, Yangyuan Wang, 2012, 2012 Symposium on VLSI Technology (VLSIT).