Patrick Girard

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Reducing power consumption during test application by test vector ordering

Serge Pravossoudovitch, Christian Landrault, Patrick Girard, 1998, ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187).

Présentation DU RLT

Patrick Girard, 2016 .

Design of routing-constrained low power scan chains

Arnaud Virazel, Patrick Girard, Y. Bonhomme, 2004 .

An alternative to fault simulation for delay-fault diagnosis

Serge Pravossoudovitch, Christian Landrault, Patrick Girard, 1992, [1992] Proceedings The European Conference on Design Automation.

Energy Model based Control for Forming Processes

Patrick Girard, Vincent Thomson, 2008, ICINCO-ICSO.

Reduction of power consumption during test application by test vector ordering

S. Pravossoudovitch, Patrick Girard, C. Landrault, 1997 .

Delay fault propagation in synchronous sequential circuits

Patrick Girard, C. Landrault, S. Pravossoudovitch, 1994 .

Unified Framework for Logic Diagnosis

Serge Pravossoudovitch, Christian Landrault, Patrick Girard, 2006 .

Low-Power Testing

Nur A. Touba, Xiaoqing Wen, Patrick Girard, 2008 .

Random Adjacent Sequences

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 2002 .

A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

Arnaud Virazel, Alberto Bosio, Mario Barbareschi, 2019, IEEE Transactions on Nanotechnology.

Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs

Arnaud Virazel, Luigi Dilillo, Christian Landrault, 2008 .

Delay Fault Diagnosis by

Serge Pravossoudovitch, Patrick Girard, Christian Iandrault, 1992 .

Embedded Flash Testing

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 2007 .

Bringing Programming by Demonstration to CAD Users

Patrick Girard, P. Girard, 2001, Your Wish is My Command.

Delay fault propagation in synchronous sequential circuits

Patrick Girard, C. Landrault, S. Pravossoudovitch, 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).

An agent based architecture for model based control

Benoit Boulet, Patrick Girard, Vincent Thomson, 2004, 2004 IEEE International Conference on Systems, Man and Cybernetics (IEEE Cat. No.04CH37583).

A New Scan-BIST Structures to Test delay Faults in Sequential Circuits

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 1998 .

Session details: Advances in design-for-testability methods

Erik Jan Marinissen, Patrick Girard, Tom Williams, 2005, DAC '05.

Framework for Logic Diagnosis

Arnaud Virazel, Christian Landrault, Patrick Girard, 2006 .

Knowledge, friendship and social announcements

Fenrong Liu, Jeremy Seligman, Patrick Girard, 2013 .

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2008 .

Tutorial intitulé "Power-Aware Testing and Test Strategies for Low Power Devices"

Xiaoqing Wen, Nicola Nicolici, Patrick Girard, 2010 .

Models for Power-Aware Testing

Hans-Joachim Wunderlich, Patrick Girard, 2010 .

Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005 .

On hardware generation of random single input change test sequences

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 2001, IEEE European Test Workshop, 2001..

Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique de Fin d'Année)

Christian Landrault, Florence Azaïs, Michel Renovell, 2002 .

Timing Defect Analysis in Look-Up Tables of SRAM-Based FPGAs

Serge Pravossoudovitch, Olivier Heron, Michel Renovell, 2003 .

Can we Approximate the Test of Integrated Circuits

Arnaud Virazel, Alberto Bosio, Mario Barbareschi, 2017 .

TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année

Giorgio Di Natale, Arnaud Virazel, Alberto Bosio, 2010 .

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, 2013, 2013 22nd Asian Test Symposium.

Reliable method for delay-fault diagnosis

Serge Pravossoudovitch, Christian Landrault, Patrick Girard, 1991 .

A global process for using model-driven approaches in user interface design

Sybille Caffiau, Patrick Girard, 2010 .

RSIC Generation: A Solution for Logic BIST

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 2008 .

Table of Contents: ATS 2006 Proceedings of the 15 th Asian Test Symposium

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 2006 .

Test de Circuits et de Systèmes Intégrés

Christian Landrault, Florence Azaïs, Michel Renovell, 2004 .

End User Programming Environments : Interactive Programming-on-Example in CAD parametric Design

Laurent Guittet, Patrick Girard, Guy Pierra, 1990, Eurographics.

Power Conscious Testing

Christian Landrault, Patrick Girard, Y. Bonhomme, 2003 .

A Survey of Test and Reliability Solutions for Magnetic Random Access Memories

Mehdi B. Tahoori, Rajendra Bishnoi, Patrick Girard, 2021, Proceedings of the IEEE.

NOTERE-Session 7-Test, performance

Patrick Girard, 2013 .

Modal Logic for Lexicographic Preference Aggregation

Patrick Girard, 2011 .

Unified Diagnostic Method Targeting Several Fault Models

Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, 2006 .

Technique for reducing power consumption in CMOS circuits

S. Pravossoudovitch, Patrick Girard, C. Landrault, 1997 .

Conditions pour le Test de Pannes de Délai des Look-Up Table dans les FPGA à Base de SRAM

Olivier Heron, Michel Renovell, Patrick Girard, 2008 .

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2004 .

An Experimental Comparative Study of Fault-Tolerant Architectures

Arnaud Virazel, Alberto Bosio, Patrick Girard, 2015 .

BIST test pattern generator for delay testing

S. Pravossoudovitch, Patrick Girard, C. Landrault, 1997 .

Delay-fault diagnosis based on critical path tracing from symbolic simulation

Serge Pravossoudovitch, Christian Landrault, Patrick Girard, 1992, [Proceedings] 1992 IEEE International Symposium on Circuits and Systems.