Shunichi Wakashima

发表

A linear response single exposure CMOS image sensor with 0.5e− readout noise and 76ke− full well capacity

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015, 2015 Symposium on VLSI Circuits (VLSI Circuits).

[Paper] A CMOS Image Sensor with 240 μV/e– Conversion Gain, 200 ke– Full Well Capacity, 190-1000 nm Spectral Response and High Robustness to UV light

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

[Paper] Floating Capacitor Load Readout Operation for Small, Low Power Consumption and High S/N Ratio CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry

Rihito Kuroda, Tsung-Ling Li, Shigetoshi Sugawa, 2013, Electronic Imaging.

[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .

A CMOS Image Sensor Using Column-Parallel Forward Noise-Canceling Circuitry

Rihito Kuroda, Tsung-Ling Li, Shigetoshi Sugawa, 2013 .

A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016, 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits).

[Papers] A Multi Spectral Imaging System with a 71dB SNR 190-1100 nm CMOS Image Sensor and an Electrically Tunable Multi Bandpass Filter

Takahiro Ishinabe, Hideo Fujikake, Rihito Kuroda, 2018 .

Analysis of pixel gain and linearity of CMOS image sensor using floating capacitor load readout operation

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015, Electronic Imaging.

[Paper] Analysis and Reduction Technologies of Floating Diffusion Capacitance in CMOS Image Sensor for Photon-Countable Sensitivity

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

A CMOS Image Sensor with 240 μ V / e-Conversion Gain , 200 ke-Full Well Capacity and 190-1000 nm Spectral Response

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015 .

Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .