M. Shimada

Reduction of particle contamination in an actual plasma etching process

T. Moriya, H. Nagaike, T. Murakami, 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..

Application of algorithms for estimating surface soil moisture and roughness parameters using CRL/NASDA airborne SAR (PI-SAR) data

M. Shimada, T. Tadono, M. Qong, 2000, IGARSS 2000. IEEE 2000 International Geoscience and Remote Sensing Symposium. Taking the Pulse of the Planet: The Role of Remote Sensing in Managing the Environment. Proceedings (Cat. No.00CH37120).