Roman Barsky

Reliability and yield: a joint defect-oriented approach

Israel A. Wagner, Roman Barsky, 2004, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..

Electromigration-dependent parametric yield estimation

Israel A. Wagner, Roman Barsky, 2004, Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004..