Charles H. Ouyang

A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Wojciech Maly, Witold A. Pleskacz, Charles H. Ouyang, 1999, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Detection of an antenna effect in VLSI designs

Wojciech Maly, Sury Maturi, Subhendra Ghosh, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Extraction of critical areas for opens in large VLSI circuits

Wojciech Maly, Witold A. Pleskacz, Charles H. Ouyang, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

CAD at the design-manufacturing interface

Wojciech Maly, Witold A. Pleskacz, Pranab K. Nag, 1997, DAC.

Maximizing wafer productivity through layout optimizations

Jitendra Khare, Saghir A. Shaikh, Hans T. Heineken, 2000, VLSI Design 2000. Wireless and Digital Imaging in the Millennium. Proceedings of 13th International Conference on VLSI Design.

Design-manufacturing interface: Part II - applications

Wojciech Maly, P. Simon, Pranab K. Nag, 1998, DATE.