Da-Ming Chang

A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy

Yu-Jen Huang, Jin-Fu Li, Da-Ming Chang, 2006, 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy

Yu-Jen Huang, Jin-Fu Li, Da-Ming Chang, 2008, J. Electron. Test..

A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap

Jin-Fu Li, Tsu-Wei Tseng, Da-Ming Chang, 2006, Proceedings of the Design Automation & Test in Europe Conference.

A Built-In Redundancy-Analysis Scheme for RAMs with Two-Level Redundancy

Yu-Jen Huang, Jin-Fu Li, Da-Ming Chang, 2006 .