Yusuke Onuki

4.5 A 1.8erms− temporal noise over 110dB dynamic range 3.4µm pixel pitch global shutter CMOS image sensor with dual-gain amplifiers, SS-ADC and multiple-accumulation shutter

Masahiro Kobayashi, Hidekazu Takahashi, Shunsuke Inoue, 2017, 2017 IEEE International Solid-State Circuits Conference (ISSCC).

A 1.8e $^{-}_{\mathrm {rms}} $ Temporal Noise Over 110-dB-Dynamic Range 3.4 $\mu \text{m}$ Pixel Pitch Global-Shutter CMOS Image Sensor With Dual-Gain Amplifiers SS-ADC, Light Guide Structure, and Multiple-Accumulation Shutter

Hidekazu Takahashi, Shunsuke Inoue, Takeshi Akiyama, 2018, IEEE Journal of Solid-State Circuits.

A 1.8e− temporal noise over 90dB dynamic range 4k2k super 35mm format seamless global shutter CMOS image sensor with multiple accumulation shutter technology

Hidekazu Takahashi, Shunsuke Inoue, Hiroshi Sekine, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Development of Gentle Slope Light Guide Structure in a 3.4 μm Pixel Pitch Global Shutter CMOS Image Sensor with Multiple Accumulation Shutter Technology †

Masahiro Kobayashi, Hidekazu Takahashi, Shunsuke Inoue, 2017, Sensors.