D. Bru

Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis

D. Faure, C. Ali, C. Giret, 2002, Microelectron. Reliab..

Gate oxide breakdown characterization on 0.13mum CMOS technology

K. Christensen, D. Faure, C. Ali, 2003, Microelectron. Reliab..

Quantification of the Detrimental Effect of a Single Primer-Template Mismatch by Real-Time PCR Using the 16S rRNA Gene as an Example

D. Bru, F. Martin-Laurent, L. Philippot, 2008, Applied and Environmental Microbiology.