Fadi Batarseh

发表

Hybrid OPC flow with pattern search and replacement

Jingyu Wang, Piyush Verma, Shikha Somani, 2015, Advanced Lithography.

Model-based virtual VSB mask writer verification for efficient mask error checking and optimization prior to MDP

Piyush Verma, Fadi Batarseh, Keith Standiford, 2014, Photomask Technology.

VLSI physical design analyzer: A profiling and data mining tool

Piyush Verma, Shikha Somani, Fadi Batarseh, 2015, Advanced Lithography.

Methodology to extract, data mine and score geometric constructs from physical design layouts for analysis and applications in semiconductor manufacturing

Frank E. Gennari, Jason Sweis, Ya-Chieh Lai, 2016, SPIE Advanced Lithography.

Dynamic pattern matching flow to enable low escape rate weak point detection

Fadi Batarseh, Janam Bakshi, Uwe Paul Schroeder, 2020 .

Aerial image ORC checks and their correlation to wafer-edge yield limitation for metals: a study and an OPC resolution

Ahmed Khalil, Pietro Babighian, Fadi Batarseh, 2017, Photomask Technology.

Litho friendly via insertion with in-design auto-fix flow using machine learning

Fadi Batarseh, Jason P. Cain, Nishant Shah, 2018, Advanced Lithography.

Efficient full-chip QA Tool for design to mask (D2M) feature variability verification

Piyush Verma, Shikha Somani, Fadi Batarseh, 2014, Photomask Technology.

Pattern-based pre-OPC operation to improve model-based OPC runtime

Jingyu Wang, Piyush Verma, Shikha Somani, 2014, Photomask Technology.

Deep learning-based hotspot prediction of via printability in process window corners

Fadi Batarseh, Sriram Madhavan, Punitha Selvam, 2021 .

Pattern similarity profiling using semi-supervised learning algorithm

Ya-Chieh Lai, Piyush Pathak, Fadi Batarseh, 2021 .