Sriram Madhavan

发表

Hybrid OPC flow with pattern search and replacement

Jingyu Wang, Piyush Verma, Shikha Somani, 2015, Advanced Lithography.

Framework for identifying recommended rules and DFM scoring model to improve manufacturability of sub-20nm layout design

Piyush Pathak, Sriram Madhavan, Shobhit Malik, 2012, Advanced Lithography.

VLSI physical design analyzer: A profiling and data mining tool

Piyush Verma, Shikha Somani, Fadi Batarseh, 2015, Advanced Lithography.

Automated yield enhancements implementation on full 28nm chip: challenges and statistics

Piyush Pathak, Sriram Madhavan, Shobhit Malik, 2012, Advanced Lithography.

Co-optimizing DFM enhancements and their impact on layout-induced circuit performance for analog designs

Sriram Madhavan, Lynn T.-N. Wang, Vikas Mehrotra, 2020 .

Methodology to extract, data mine and score geometric constructs from physical design layouts for analysis and applications in semiconductor manufacturing

Frank E. Gennari, Jason Sweis, Ya-Chieh Lai, 2016, SPIE Advanced Lithography.

Optimization of self-aligned double patterning (SADP)-compliant layout designs using pattern matching for 10nm technology nodes and beyond

Jia Zeng, Youngtag Woo, Sriram Madhavan, 2016, SPIE Advanced Lithography.

Design for manufacturability for analog, radio frequency, and millimeter wave designs

Yongfu Li, Zhao Chuan Lee, Sriram Madhavan, 2019, Advanced Lithography.

A methodology to optimize design pattern context size for higher sensitivity to hotspot detection using pattern association tree (PAT)

Piyush Verma, Shikha Somani, Piyush Pathak, 2015, Advanced Lithography.

Optimization of self-aligned double patterning (SADP)-compliant layout designs using pattern matching for sub-20nm metal routing

Sriram Madhavan, Lynn T.-N. Wang, Uwe Paul Schroeder, 2017, Advanced Lithography.

Decomposition-aware layout optimization for 20/14nm standard cells

Sriram Madhavan, Shobhit Malik, Lynn T.-N. Wang, 2014, Advanced Lithography.

Smart double-cut via insertion flow with dynamic design-rules compliance for fast new technology adoption

Piyush Pathak, Sriram Madhavan, Shobhit Malik, 2012, Advanced Lithography.

A pattern-based methodology for optimizing stitches in double-patterning technology

Vito Dai, Sriram Madhavan, Lynn T.-N. Wang, 2015, Advanced Lithography.

A scoring methodology for quantitatively evaluating the quality of double patterning technology-compliant layouts

Piyush Pathak, Sriram Madhavan, Shobhit Malik, 2012, Advanced Lithography.

Timing variability analysis for layout-dependent-effects in 28nm custom and standard cell-based designs

Piyush Pathak, Sriram Madhavan, Rasit O. Topaloglu, 2011, Advanced Lithography.

Quantifying electrical impacts on redundant wire insertion in 7nm unidirectional designs

Sriram Madhavan, Shobhit Malik, Ramya Srinivasan, 2017, Advanced Lithography.

Post-decomposition optimizations using pattern matching and rule-based clustering for multi-patterning technology

Sriram Madhavan, Lynn T.-N. Wang, 2018, Advanced Lithography.

Deriving Feature Fail Rate from Silicon Volume Diagnostics Data

Thomas Herrmann, Sriram Madhavan, Shobhit Malik, 2013, IEEE Design & Test.

Pattern-based pre-OPC operation to improve model-based OPC runtime

Jingyu Wang, Piyush Verma, Shikha Somani, 2014, Photomask Technology.

Quantified contribution of design for manufacturing to yield at 28nm

Sriram Madhavan, Shobhit Malik, Thomas Herrmann, 2014, 2014 19th IEEE European Test Symposium (ETS).

Foundry approach for layout risk assessment through comprehensive pattern harvesting and large-scale data analysis

Joo Hyun Park, Qian Xie, Sriram Madhavan, 2020 .

Deep learning-based hotspot prediction of via printability in process window corners

Fadi Batarseh, Sriram Madhavan, Punitha Selvam, 2021 .

Pattern similarity profiling using semi-supervised learning algorithm

Ya-Chieh Lai, Piyush Pathak, Fadi Batarseh, 2021 .

Electrical design-for-manufacturability (DFM) checks for reducing layout-induced circuit variability for analog designs

Zhao Chuan Lee, Sriram Madhavan, Michael Simcoe, 2021 .