M. Denais
发表
Nicolas Planes,
Frederic Boeuf,
Pierre Morin,
2005
.
G. Ribes,
M. Denais,
D. Roy,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
G. Ghibaudo,
T. Skotnicki,
G. Ribes,
2006,
IEEE Transactions on Device and Materials Reliability.
M. Denais,
Vincent Huard,
C. Guérin,
2007,
PATMOS.
M. Denais,
Vincent Huard,
Nathalie Revil,
2005,
Microelectron. Reliab..
G. Ribes,
M. Denais,
Vincent Huard,
2005,
Microelectron. Reliab..
M. Denais,
Vincent Huard,
Didier Goguenheim,
2005,
Microelectron. Reliab..
G. Ribes,
M. Denais,
A. Bravaix,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
M. Woo,
N. Planes,
R. Palla,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
G. Ribes,
M. Denais,
Vincent Huard,
2006,
Microelectron. Reliab..
G. Ribes,
M. Denais,
Gérard Ghibaudo,
2005,
Microelectron. Reliab..
G. Ribes,
M. Denais,
A. Bravaix,
2005,
2005 IEEE International Integrated Reliability Workshop.
G. Ribes,
M. Denais,
Alain Bravaix,
2003,
IEEE International Integrated Reliability Workshop Final Report, 2003.
G. Ribes,
M. Denais,
A. Bravaix,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
M. Denais,
Alain Bravaix,
V. Huard,
2006
.
M. Denais,
Vincent Huard,
C. R. Parthasarathy,
2006,
Microelectron. Reliab..
P. Abramowitz,
M. Woo,
N. Planes,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
B. Tavel,
M. Bidaud,
M. Denais,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
G. Ghibaudo,
T. Skotnicki,
G. Ribes,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
N. Revil,
G. Ribes,
M. Denais,
2004,
IEEE International Integrated Reliability Workshop Final Report, 2004.
Gerard Ghibaudo,
G. Ribes,
M. Denais,
2004
.
G. Ribes,
M. Denais,
V. Huard,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
G. Ghibaudo,
T. Skotnicki,
G. Ribes,
2005,
2005 IEEE International Integrated Reliability Workshop.
G. Ghibaudo,
G. Ribes,
M. Denais,
2004,
IEEE International Integrated Reliability Workshop Final Report, 2004.
M. Denais,
V. Huard,
A. Bravaix,
2005,
2005 IEEE International Integrated Reliability Workshop.
G. Ghibaudo,
G. Ribes,
M. Denais,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
N. Planes,
N. Revil,
B. Tavel,
2003,
IEEE International Electron Devices Meeting 2003.
R. Palla,
B. Tavel,
C. Ortolland,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
M. Denais,
V. Huard,
A. Bravaix,
2006,
2006 IEEE International Integrated Reliability Workshop Final Report.