Dan Lake

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

James Tschanz, Heather Quinn, Shekhar Borkar, 2017, 2017 Symposium on VLSI Circuits.

Distributed scene graph to enable thousands of interacting users in a virtual environment

Mic Bowman, Huaiyu Liu, Dan Lake, 2010, 2010 9th Annual Workshop on Network and Systems Support for Games.

Scaling virtual worlds: Simulation requirements and challenges

Mic Bowman, Robert Adams, Huaiyu Liu, 2010, Proceedings of the 2010 Winter Simulation Conference.

Navigating large data sets in virtual worlds

Mic Bowman, Robert Adams, Huaiyu Liu, 2012, 2012 IEEE Virtual Reality Workshops (VRW).

An ultra-dense irradiation test structure with a NAND/NOR readout chain for characterizing soft error rates of 14nm combinational logic circuits

James Tschanz, Chris H. Kim, Shekhar Borkar, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).

A Back-Sampling Chain Technique for Accelerated Detection, Characterization, and Reconstruction of Radiation-Induced Transient Pulses

Chris H. Kim, Andres Malavasi, Luke R. Everson, 2021, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.