Lwin Hnin Ei

Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview

Venkat Ravikumar, Vinod Narang, Xiaole Zhao, 2011, Microelectron. Reliab..

Recent advances in fault isolation for semiconductor industry

Vinod Narang, Wen Qiu, Joseph Tan, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).