Ralph Marlett

EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits

Ralph Marlett, R. Marlett, 1978, 15th Design Automation Conference.

Selectable Length Partial Scan: A Method to Reduce Vector Length

Ralph Marlett, Sean P. Morley, R. Marlett, 1991, 1991, Proceedings. International Test Conference.

An Effective Test Generation System for Sequential Circuits

Ralph Marlett, R. Marlett, 1986, 23rd ACM/IEEE Design Automation Conference.