François-Fabien Ferhani

Classifying Bad Chips and Ordering Test Sets

Edward J. McCluskey, François-Fabien Ferhani, 2006, 2006 IEEE International Test Conference.

ELF-Murphy data on defects and tests sets

Ahmad A. Al-Yamani, Edward J. McCluskey, Chien-Mo James Li, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

How Many Test Patterns are Useless?

Edward J. McCluskey, Nirmal R. Saxena, Phil Nigh, 2008, 26th IEEE VLSI Test Symposium (vts 2008).