C. M. Drum

Yield Model with Critical Geometry Analysis for Yield Projection from Test Sites on a Wafer Basis with Confidence Limits

C. M. Drum, D. L. Gerlach, 1990 .

Applications of a mechanistic yield model for MOSIC chips

C. M. Drum, 1991, [Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems.