Roy W. Knight

发表

Michael C. Hamilton, Chandan K. Roy, Sushil Bhavnani, 2015, Microelectron. Reliab..

Sushil Bhavnani, R. Wayne Johnson, Roy W. Knight, 2014, Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).

Sushil H. Bhavnani, Roy W. Knight, John F. Maddox, 2013 .

Roy W. Knight, J. S. Goodling, R. Knight, 1991 .

Roy W. Knight, J. C. Suhling, Chris S. Romanczuk, 1994, 1994 Proceedings. 44th Electronic Components and Technology Conference.

Sushil H. Bhavnani, Roy W. Knight, John F. Maddox, 2010, 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.

Sushil H. Bhavnani, R. Wayne Johnson, Roy W. Knight, 2014, 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).