Yoshiaki Kamigaki

New Phenomena in MNOS Retention Characteristics and Their Application to Memory Device Design for Megabit EEPROM's

Takaaki Hagiwara, Sin-ichi Minami, Yoshiaki Kamigaki, 1988 .

Improving program/erase endurance by controlling the inter-poly process in flash memory

Yoshiaki Kamigaki, Hitoshi Kume, Yuzuru Ohji, 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

MNOS Nonvolatile Semiconductor Memory Technology: Present and Future

Yoshiaki Kamigaki, Yoshiaki Kamigaki, Shinichi Minami, 2001 .

Tunnel Oxide Thickness Optimization for High-Performance MNOS Nonvolatile Memory Devices

Yoshiaki Kamigaki, Shinichi Minami, 1991 .

A highly reliable 256‐kb MNOS EEPROM: Memory cell design technology

Takaaki Hagiwara, Yoshiaki Kamigaki, Ken Uchida, 1990 .

Semiconductor integrated circuit, circuit programming system and circuit programming process same

Hiroo Masuda, Eiji Takeda, Yoshiaki Kamigaki, 1980 .