Koichi Nagasawa

New Phenomena in MNOS Retention Characteristics and Their Application to Memory Device Design for Megabit EEPROM's

Takaaki Hagiwara, Sin-ichi Minami, Yoshiaki Kamigaki, 1988 .

Time Dependent Dielectric Breakdown of Thin SiO2 Films

Koichi Nagasawa, Makoto Hirayama, Sotoju Asai, 1981 .