Jeremias D. Romero

Impact of optical absorption on process control for sub-0.15-nm device patterning using 193-nm lithography

Harry J. Levinson, Bhanwar Singh, Uzodinma Okoroanyanwu, 2000, Advanced Lithography.

Outgassing behavior of spin-on-glass (SOG)

Jeremias D. Romero, Muhib M. Khan, Homi Fatemi, 1991 .

Effect of high thermal stability mold material on the gold-aluminum bond reliability in epoxy encapsulated VLSI devices

Jeremias D. Romero, Muhib M. Khan, Homi Fatemi, 1988 .